Applied Scanning Probe Methods IV Industrial Applications /
Guardat en:
| Autor corporatiu: | |
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| Altres autors: | , |
| Format: | Electrònic eBook |
| Idioma: | English |
| Publicat: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2006.
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| Edició: | 1st ed. 2006. |
| Periòdiques: | NanoScience and Technology,
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| Matèries: | |
| Accés en línia: | https://doi.org/10.1007/b138289 |
| Etiquetes: |
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Taula de continguts:
- Scanning Probe Lithography for Chemical, Biological and Engineering Applications
- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM)
- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography
- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography
- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM)
- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection
- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices
- Applications of Heated Atomic Force Microscope Cantilevers.



