Applied Scanning Probe Methods IV Industrial Applications /

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Korporativní autor: SpringerLink (Online service)
Další autoři: Bhushan, Bharat. (Editor, http://id.loc.gov/vocabulary/relators/edt), Fuchs, Harald. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Médium: Elektronický zdroj E-kniha
Jazyk:English
Vydáno: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006.
Vydání:1st ed. 2006.
Edice:NanoScience and Technology,
Témata:
On-line přístup:https://doi.org/10.1007/b138289
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Obsah:
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  • Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM)
  • Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography
  • Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography
  • Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM)
  • Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection
  • Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices
  • Applications of Heated Atomic Force Microscope Cantilevers.