Delwedd Flaen

Applied Scanning Probe Methods IV Industrial Applications /

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Awdur Corfforaethol: SpringerLink (Online service)
Awduron Eraill: Bhushan, Bharat. (Golygydd, http://id.loc.gov/vocabulary/relators/edt), Fuchs, Harald. (Golygydd, http://id.loc.gov/vocabulary/relators/edt)
Fformat: Electronig eLyfr
Iaith:English
Cyhoeddwyd: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006.
Rhifyn:1st ed. 2006.
Cyfres:NanoScience and Technology,
Pynciau:
Nanotechnology.
Spectroscopy.
Microscopy.
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Materials—Surfaces.
Polymers  .
Nanotechnology and Microengineering.
Spectroscopy and Microscopy.
Surface and Interface Science, Thin Films.
Surfaces and Interfaces, Thin Films.
Polymer Sciences.
Mynediad Ar-lein:https://doi.org/10.1007/b138289
Tagiau: Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
Tabl Cynhwysion:
  • Scanning Probe Lithography for Chemical, Biological and Engineering Applications
  • Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM)
  • Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography
  • Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography
  • Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM)
  • Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection
  • Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices
  • Applications of Heated Atomic Force Microscope Cantilevers.

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