Applied Scanning Probe Methods IV Industrial Applications /

Gardado en:
Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Outros autores: Bhushan, Bharat. (Editor, http://id.loc.gov/vocabulary/relators/edt), Fuchs, Harald. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Formato: Electrónico eBook
Idioma:English
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Series:NanoScience and Technology,
Subjects:
Acceso en liña:https://doi.org/10.1007/b138289
Tags: Engadir etiqueta
Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!
Table of Contents:
  • Scanning Probe Lithography for Chemical, Biological and Engineering Applications
  • Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM)
  • Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography
  • Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography
  • Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM)
  • Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection
  • Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices
  • Applications of Heated Atomic Force Microscope Cantilevers.