Applied Scanning Probe Methods IX Characterization /

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VII...

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Ente Autore: SpringerLink (Online service)
Altri autori: Bhushan, Bharat. (Redattore, http://id.loc.gov/vocabulary/relators/edt), Fuchs, Harald. (Redattore, http://id.loc.gov/vocabulary/relators/edt), Tomitori, Masahiko. (Redattore, http://id.loc.gov/vocabulary/relators/edt)
Natura: Elettronico eBook
Lingua:English
Pubblicazione: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edizione:1st ed. 2008.
Serie:NanoScience and Technology,
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Accesso online:https://doi.org/10.1007/978-3-540-74083-4
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Sommario:
  • Ultrathin Fullerene-Based Films via STM and STS
  • Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode
  • Advances in SPMs for Investigation and Modification of Solid-Supported Monolayers
  • Atomic Force Microscopy Studies of the Mechanical Properties of Living Cells
  • Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope
  • Cellular Physiology of Epithelium and Endothelium
  • Application of Atomic Force Microscopy to the Study of Expressed Molecules in or on a Single Living Cell
  • What Can Atomic Force Microscopy Say About Amyloid Aggregates?
  • Atomic Force Microscopy: Interaction Forces Measured in Phospholipid Monolayers, Bilayers and Cell Membranes
  • Self-Assembled Monolayers on Aluminum and Copper Oxide Surfaces: Surface and Interface Characteristics, Nanotribological Properties, and Chemical Stability
  • High Sliding Velocity Nanotribological Investigations of Materials for Nanotechnology Applications
  • Measurement of the Mechanical Properties of One-Dimensional Polymer Nanostructures by AFM
  • Evaluating Tribological Properties of Materials for Total Joint Replacements Using Scanning Probe Microscopy
  • Near-Field Optical Spectroscopy of Single Quantum Constituents.