Applied Scanning Probe Methods IX Characterization /
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VII...
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| Korporativna značnica: | |
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| Drugi avtorji: | , , |
| Format: | Elektronski eKnjiga |
| Jezik: | English |
| Izdano: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2008.
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| Izdaja: | 1st ed. 2008. |
| Serija: | NanoScience and Technology,
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| Teme: | |
| Online dostop: | https://doi.org/10.1007/978-3-540-74083-4 |
| Oznake: |
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Kazalo:
- Ultrathin Fullerene-Based Films via STM and STS
- Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode
- Advances in SPMs for Investigation and Modification of Solid-Supported Monolayers
- Atomic Force Microscopy Studies of the Mechanical Properties of Living Cells
- Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope
- Cellular Physiology of Epithelium and Endothelium
- Application of Atomic Force Microscopy to the Study of Expressed Molecules in or on a Single Living Cell
- What Can Atomic Force Microscopy Say About Amyloid Aggregates?
- Atomic Force Microscopy: Interaction Forces Measured in Phospholipid Monolayers, Bilayers and Cell Membranes
- Self-Assembled Monolayers on Aluminum and Copper Oxide Surfaces: Surface and Interface Characteristics, Nanotribological Properties, and Chemical Stability
- High Sliding Velocity Nanotribological Investigations of Materials for Nanotechnology Applications
- Measurement of the Mechanical Properties of One-Dimensional Polymer Nanostructures by AFM
- Evaluating Tribological Properties of Materials for Total Joint Replacements Using Scanning Probe Microscopy
- Near-Field Optical Spectroscopy of Single Quantum Constituents.



