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Transmission Electron Microscopy and Diffractometry of Materials

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...

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書誌詳細
主要な著者: Fultz, Brent. (著者, http://id.loc.gov/vocabulary/relators/aut), Howe, James. (http://id.loc.gov/vocabulary/relators/aut)
団体著者: SpringerLink (Online service)
フォーマット: 電子媒体 eBook
言語:English
出版事項: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
版:4th ed. 2013.
シリーズ:Graduate Texts in Physics,
主題:
Spectroscopy.
Microscopy.
Materials science.
Materials—Surfaces.
Thin films.
Surfaces (Physics).
Interfaces (Physical sciences).
Spectroscopy and Microscopy.
Characterization and Evaluation of Materials.
Spectroscopy/Spectrometry.
Surfaces and Interfaces, Thin Films.
Surface and Interface Science, Thin Films.
オンライン･アクセス:https://doi.org/10.1007/978-3-642-29761-8
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https://doi.org/10.1007/978-3-642-29761-8

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