প্রচ্ছদ

Transmission Electron Microscopy and Diffractometry of Materials

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...

সম্পূর্ণ বিবরণ

সংরক্ষণ করুন:
গ্রন্থ-পঞ্জীর বিবরন
প্রধান লেখক: Fultz, Brent. (Author, http://id.loc.gov/vocabulary/relators/aut), Howe, James. (http://id.loc.gov/vocabulary/relators/aut)
সংস্থা লেখক: SpringerLink (Online service)
বিন্যাস: বৈদ্যুতিক বৈদ্যুতিন গ্রন্থ
ভাষা:English
প্রকাশিত: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
সংস্করন:4th ed. 2013.
মালা:Graduate Texts in Physics,
বিষয়গুলি:
Spectroscopy.
Microscopy.
Materials science.
Materials—Surfaces.
Thin films.
Surfaces (Physics).
Interfaces (Physical sciences).
Spectroscopy and Microscopy.
Characterization and Evaluation of Materials.
Spectroscopy/Spectrometry.
Surfaces and Interfaces, Thin Films.
Surface and Interface Science, Thin Films.
অনলাইন ব্যবহার করুন:https://doi.org/10.1007/978-3-642-29761-8
ট্যাগগুলো: ট্যাগ যুক্ত করুন
কোনো ট্যাগ নেই, প্রথমজন হিসাবে ট্যাগ করুন!
সূচিপত্রের সারণি:
  • Diffraction and X-Ray Powder Diffractometer Problems
  • TEM and its Optics Problems
  • Neutron Scattering Problems
  • Scattering Problems
  • Inelastic Electron Scattering and Spectroscopy Problems
  • Diffraction from Crystals Sphere Problems
  • Electron Diffraction and Crystallography Problems
  • Diffraction Contrast in TEM Images Problems
  • Diffraction Lineshapes Problems
  • Patterson Functions and Diffuse Scattering Problems
  • High-Resolution TEM Imaging Problems
  • High-Resolution STEM and Related Imaging Techniques Problems
  • Dynamical Theory Problems.

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