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Transmission Electron Microscopy and Diffractometry of Materials

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...

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Autors principals: Fultz, Brent. (Autor, http://id.loc.gov/vocabulary/relators/aut), Howe, James. (http://id.loc.gov/vocabulary/relators/aut)
Autor corporatiu: SpringerLink (Online service)
Format: Electrònic eBook
Idioma:English
Publicat: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Edició:4th ed. 2013.
Periòdiques:Graduate Texts in Physics,
Matèries:
Spectroscopy.
Microscopy.
Materials science.
Materials—Surfaces.
Thin films.
Surfaces (Physics).
Interfaces (Physical sciences).
Spectroscopy and Microscopy.
Characterization and Evaluation of Materials.
Spectroscopy/Spectrometry.
Surfaces and Interfaces, Thin Films.
Surface and Interface Science, Thin Films.
Accés en línia:https://doi.org/10.1007/978-3-642-29761-8
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Taula de continguts:
  • Diffraction and X-Ray Powder Diffractometer Problems
  • TEM and its Optics Problems
  • Neutron Scattering Problems
  • Scattering Problems
  • Inelastic Electron Scattering and Spectroscopy Problems
  • Diffraction from Crystals Sphere Problems
  • Electron Diffraction and Crystallography Problems
  • Diffraction Contrast in TEM Images Problems
  • Diffraction Lineshapes Problems
  • Patterson Functions and Diffuse Scattering Problems
  • High-Resolution TEM Imaging Problems
  • High-Resolution STEM and Related Imaging Techniques Problems
  • Dynamical Theory Problems.

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