Значок книги

Transmission Electron Microscopy and Diffractometry of Materials

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...

Полное описание

Сохранить в:
Библиографические подробности
Главные авторы: Fultz, Brent. (Автор, http://id.loc.gov/vocabulary/relators/aut), Howe, James. (http://id.loc.gov/vocabulary/relators/aut)
Соавтор: SpringerLink (Online service)
Формат: Электронный ресурс eКнига
Язык:English
Опубликовано: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Редактирование:4th ed. 2013.
Серии:Graduate Texts in Physics,
Предметы:
Spectroscopy.
Microscopy.
Materials science.
Materials—Surfaces.
Thin films.
Surfaces (Physics).
Interfaces (Physical sciences).
Spectroscopy and Microscopy.
Characterization and Evaluation of Materials.
Spectroscopy/Spectrometry.
Surfaces and Interfaces, Thin Films.
Surface and Interface Science, Thin Films.
Online-ссылка:https://doi.org/10.1007/978-3-642-29761-8
Метки: Добавить метку
Нет меток, Требуется 1-ая метка записи!
Оглавление:
  • Diffraction and X-Ray Powder Diffractometer Problems
  • TEM and its Optics Problems
  • Neutron Scattering Problems
  • Scattering Problems
  • Inelastic Electron Scattering and Spectroscopy Problems
  • Diffraction from Crystals Sphere Problems
  • Electron Diffraction and Crystallography Problems
  • Diffraction Contrast in TEM Images Problems
  • Diffraction Lineshapes Problems
  • Patterson Functions and Diffuse Scattering Problems
  • High-Resolution TEM Imaging Problems
  • High-Resolution STEM and Related Imaging Techniques Problems
  • Dynamical Theory Problems.

Схожие документы