Voigtländer, B. (2015). Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (1st ed. 2015.). Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer.
Citação norma ChicagoVoigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. 1st ed. 2015. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2015.
Citação norma MLAVoigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. 1st ed. 2015. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2015.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.