Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
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| 企业作者: | |
| 格式: | 电子 电子书 |
| 语言: | English |
| 出版: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
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| 版: | 1st ed. 2015. |
| 丛编: | NanoScience and Technology,
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| 主题: | |
| 在线阅读: | https://doi.org/10.1007/978-3-662-45240-0 |
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