Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
Zapisane w:
| 1. autor: | Voigtländer, Bert. (Autor, http://id.loc.gov/vocabulary/relators/aut) |
|---|---|
| Korporacja: | SpringerLink (Online service) |
| Format: | Elektroniczne E-book |
| Język: | English |
| Wydane: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
|
| Wydanie: | 1st ed. 2015. |
| Seria: | NanoScience and Technology,
|
| Hasła przedmiotowe: | |
| Dostęp online: | https://doi.org/10.1007/978-3-662-45240-0 |
| Etykiety: |
Dodaj etykietę
Nie ma etykietki, Dołącz pierwszą etykiete!
|
Podobne zapisy
-
Scanning Probe Microscopy in Nanoscience and Nanotechnology
Wydane: (2010) -
Roadmap of Scanning Probe Microscopy
Wydane: (2007) -
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Wydane: (2011) -
Three-Dimensional Nanoarchitectures Designing Next-Generation Devices /
Wydane: (2011) -
Nanostructures Fabrication and Analysis /
Wydane: (2007)



