Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
Wedi'i Gadw mewn:
| Prif Awdur: | |
|---|---|
| Awdur Corfforaethol: | |
| Fformat: | Electronig eLyfr |
| Iaith: | English |
| Cyhoeddwyd: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
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| Rhifyn: | 1st ed. 2015. |
| Cyfres: | NanoScience and Technology,
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| Pynciau: | |
| Mynediad Ar-lein: | https://doi.org/10.1007/978-3-662-45240-0 |
| Tagiau: |
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