Voigtländer, B. (2015). Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (1st ed. 2015.). Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer.
Dyfyniad Arddull ChicagoVoigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. 1st ed. 2015. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2015.
Dyfyniad MLAVoigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. 1st ed. 2015. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2015.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.