Voigtländer, B. (2015). Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (1st ed. 2015.). Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer.
シカゴスタイル引用形Voigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. 1st ed. 2015. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2015.
MLA引用形式Voigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. 1st ed. 2015. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2015.
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