Voigtländer, B. (2015). Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (1st ed. 2015.). Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer.
Chicago Style CitationVoigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. 1st ed. 2015. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2015.
MLA引文Voigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. 1st ed. 2015. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2015.
警告：这些引文格式不一定是100％准确.