Soggetti all'interno della tua ricerca.
Soggetti all'interno della tua ricerca.
Cerca anche:
interactive interface » interaction interact, interactive maintenance
interface problems » integrals problems, interaction problems, maintenance problems
using microscopy » using microsoft, resin microscopy, imaging microscopy
https » http
interactive interface » interaction interact, interactive maintenance
interface problems » integrals problems, interaction problems, maintenance problems
using microscopy » using microsoft, resin microscopy, imaging microscopy
https » http
1
Sommario:
“...Diffraction and X-Ray Powder Diffractometer Problems -- TEM and its Optics Problems -- Neutron...”
Testo
Testo
Elettronico
eBook
2
Soggetti:
“...Surfaces and Interfaces, Thin Films. https://scigraph.springernature.com/ontologies/product-market...”
Testo
Testo
Elettronico
eBook
3
Soggetti:
“...Surface and Interface Science, Thin Films. https://scigraph.springernature.com/ontologies/product...”
Testo
Testo
Elettronico
eBook
4
Sommario:
“...Introduction to the microscopy techniques -- Visualization of organic-inorganic nanostructures...”
Testo
Testo
Elettronico
eBook
5
Pubblicazione 2007
Sommario:
“... -- Characterization of Stresses and Strains in Microelectronics and Photonics Devices Using Photomechanics Methods...”Testo
Elettronico
eBook
6
Sommario:
“... and their Interactions with Magnetic Fields -- Time Dependent Fields -- Polarized Electromagnetic Waves -- History...”
Testo
Testo
Elettronico
eBook
7
Pubblicazione 2005
Sommario:
“.../Nanotribology and Materials Characterization Studies Using Scanning Probe Microscopy -- Surface Forces...”Testo
Elettronico
eBook
8
Pubblicazione 2006
Sommario:
“... Textures for a Large-Scale Environment -- Planar Surface Detection in Image Pairs Using Homographic...”Testo
Elettronico
eBook
9
Pubblicazione 2010
Sommario:
“... Ultrasound Microscopy for Imaging Young’s Modulus of Solids -- Non-Classical Nonlinearity in Solids...”Testo
Elettronico
eBook
10
Pubblicazione 2008
Sommario:
“... of Electrostatic Interactions in Atomic Force Microscopy -- Integral Representation for the Solution of a Crack...”Testo
Elettronico
eBook