1
出版事項 2005
目次: ... Scanning Probe Microscopy -- Nanoscale Probing of Physical and Chemical Functionality with Near-Field...
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2
著者: Fultz, Brent., Fultz, Brent., Howe, James.
出版事項 2013
目次: ... Contrast in TEM Images Problems -- Diffraction Lineshapes Problems -- Patterson Functions and Diffuse...
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3
著者: Fultz, Brent., Fultz, Brent., Howe, James.
出版事項 2008
目次: ... and Crystallography -- Diffraction Contrast in TEM Images -- Diffraction Lineshapes -- Patterson Functions and Diffuse...
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4
出版事項 2005
目次: ..., and Double- Perovskite Thin Films and Heterostructures -- Interfaces and Surfaces: Correlated Electron...
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5
出版事項 2007
目次: ... of Moisture on the Adhesion and Fracture of Interfaces in Microelectronic Packaging -- Highly Compliant...
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6
出版事項 2015
目次: ... Optimization for Solving Economic Dispatch with Cubic Fuel Cost Function -- Multi objective Optimization...
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7
出版事項 2015
目次: ... semiconductors and their interfaces: Experimental electronic structure of organic-device related systems...
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8
出版事項 2005
目次: ...: Applications to Direct Tunneling and Defects at Dielectric Interfaces -- Atomic Structure, Interfaces...
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9
出版事項 2014
目次: ...The Scanning Tunneling Microscopy of Adsorbed Molecules on Semiconductors: Some Theoretical Answers...
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