Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations /
This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, co...
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| Korporativní autor: | |
| Médium: | Elektronický zdroj E-kniha |
| Jazyk: | English |
| Vydáno: |
New York, NY :
Springer US : Imprint: Springer,
2010.
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| Vydání: | 1st ed. 2010. |
| Témata: | |
| On-line přístup: | https://doi.org/10.1007/978-1-4419-0931-2 |
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Obsah:
- Soft Errors
- Analytical Determination of Radiation-induced Pulse Width in Combinational Circuits
- Analytical Determination of the Radiation-induced Pulse Shape
- Modeling Dynamic Stability of SRAMs in the Presence of Radiation Particle Strikes
- 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits
- Clamping Diode-based Radiation Tolerant Circuit Design Approach
- Split-output-based Radiation Tolerant Circuit Design Approach
- Process Variations
- Sensitizable Statistical Timing Analysis
- A Variation Tolerant Combinational Circuit Design Approach Using Parallel Gates
- Process Variation Tolerant Single-supply True Voltage Level Shifter
- Conclusions and Future Directions.