Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations /
This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, co...
保存先:
| 第一著者: | |
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| 団体著者: | |
| フォーマット: | 電子媒体 eBook |
| 言語: | English |
| 出版事項: |
New York, NY :
Springer US : Imprint: Springer,
2010.
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| 版: | 1st ed. 2010. |
| 主題: | |
| オンライン･アクセス: | https://doi.org/10.1007/978-1-4419-0931-2 |
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