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Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies /

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and d...

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Bibliographic Details
Main Authors: Bosio, Alberto. (Author, http://id.loc.gov/vocabulary/relators/aut), Dilillo, Luigi. (http://id.loc.gov/vocabulary/relators/aut), Girard, Patrick. (http://id.loc.gov/vocabulary/relators/aut), Pravossoudovitch, Serge. (http://id.loc.gov/vocabulary/relators/aut), Virazel, Arnaud. (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2010.
Edition:1st ed. 2010.
Subjects:
Electronic circuits.
Computer-aided engineering.
Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
Online Access:https://doi.org/10.1007/978-1-4419-0938-1
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Table of Contents:
  • Basics on SRAM Testing
  • Resistive-Open Defects in Core-Cells
  • Resistive-Open Defects in Pre-charge Circuits
  • Resistive-Open Defects in Address Decoders
  • Resistive-Open Defects in Write Drivers
  • Resistive-Open Defects in Sense Amplifiers
  • Faults Due to Process Variations in SRAMs
  • Diagnosis and Design-for-Diagnosis.

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