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Robust SRAM Designs and Analysis

This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular...

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Bibliographic Details
Main Authors: Singh, Jawar. (Author, http://id.loc.gov/vocabulary/relators/aut), Mohanty, Saraju P. (http://id.loc.gov/vocabulary/relators/aut), Pradhan, Dhiraj K. (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Subjects:
Electronic circuits.
Electronics.
Microelectronics.
Nanotechnology.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Nanotechnology and Microengineering.
Online Access:https://doi.org/10.1007/978-1-4614-0818-5
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https://doi.org/10.1007/978-1-4614-0818-5

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