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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  The authors have created a field guide to show how to handle var...

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Bibliographic Details
Main Authors: McConaghy, Trent. (Author, http://id.loc.gov/vocabulary/relators/aut), Breen, Kristopher. (http://id.loc.gov/vocabulary/relators/aut), Dyck, Jeffrey. (http://id.loc.gov/vocabulary/relators/aut), Gupta, Amit. (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Subjects:
Electronic circuits.
Electronics.
Microelectronics.
Nanotechnology.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Nanotechnology and Microengineering.
Online Access:https://doi.org/10.1007/978-1-4614-2269-3
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https://doi.org/10.1007/978-1-4614-2269-3

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