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Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications /

Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of smal...

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Detalhes bibliográficos
Autor principal: Haschke, Michael. (Autor, http://id.loc.gov/vocabulary/relators/aut)
Autor Corporativo: SpringerLink (Online service)
Formato: Recurso Eletrônico livro eletrônico
Idioma:English
Publicado em: Cham : Springer International Publishing : Imprint: Springer, 2014.
Edição:1st ed. 2014.
coleção:Springer Series in Surface Sciences, 55
Assuntos:
Spectroscopy.
Microscopy.
Materials—Surfaces.
Thin films.
Physical measurements.
Measurement   .
Surfaces (Physics).
Interfaces (Physical sciences).
Spectroscopy and Microscopy.
Surfaces and Interfaces, Thin Films.
Measurement Science and Instrumentation.
Spectroscopy/Spectrometry.
Surface and Interface Science, Thin Films.
Acesso em linha:https://doi.org/10.1007/978-3-319-04864-2
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Sumário:
  • XRF-Basics
  • Main Components of X-Ray Spectrometers
  • Special Requirements for µ-XRF
  • Quantification
  • Sample Preparation
  • Relations to Other Analytical Methods
  • Applications.

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