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Transmission Electron Microscopy and Diffractometry of Materials

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of th...

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Bibliographic Details
Main Authors: Fultz, Brent. (Author, http://id.loc.gov/vocabulary/relators/aut), Howe, James. (http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edition:3rd ed. 2008.
Subjects:
Materials science.
Materials—Surfaces.
Thin films.
Crystallography.
Solid state physics.
Spectroscopy.
Microscopy.
Engineering.
Characterization and Evaluation of Materials.
Surfaces and Interfaces, Thin Films.
Crystallography and Scattering Methods.
Solid State Physics.
Spectroscopy and Microscopy.
Engineering, general.
Online Access:https://doi.org/10.1007/978-3-540-73886-2
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https://doi.org/10.1007/978-3-540-73886-2

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