Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design

Transparent conductive films of tin oxide were deposited on glass substrates under various deposition conditions. Taguchi analysis was used to model the dependence of the grain size, thickness and absorbance of nanocrystalline tin oxide on the process parameters namely pH value, concentration, time...

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Hoofdauteurs: Ebrahimiasl, Saeideh, Wan Yunus, Wan Md. Zin, Kassim, Anuar, Zainal, Zulkarnain
Formaat: Artikel
Taal:English
English
Gepubliceerd in: Elsevier 2010
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Online toegang:http://psasir.upm.edu.my/id/eprint/16286/1/Prediction%20of%20grain%20size.pdf
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spelling oai:psasir.upm.edu.my:16286 http://psasir.upm.edu.my/id/eprint/16286/ Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design Ebrahimiasl, Saeideh Wan Yunus, Wan Md. Zin Kassim, Anuar Zainal, Zulkarnain Transparent conductive films of tin oxide were deposited on glass substrates under various deposition conditions. Taguchi analysis was used to model the dependence of the grain size, thickness and absorbance of nanocrystalline tin oxide on the process parameters namely pH value, concentration, time of deposition and bath temperature. The effect of the mentioned process parameters on the grain size, thickness and absorbance of deposited layer during the deposition of nanocrystalline was investigated using X-ray diffraction (XRD) technique, atomic force microscopy (AFM) and UV–Visible spectroscopy. Comparison between the model predictions and the experimental observations predicted a remarkable agreement between them. The predictions of the model and sensitivity analysis showed that among the effective process parameters, deposition time and concentration were the main parameters having significant effect on crystalline size. Bath temperature had the most significant effect on absorbance and deposition time had a dominant effect on thickness. Elsevier 2010 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/16286/1/Prediction%20of%20grain%20size.pdf Ebrahimiasl, Saeideh and Wan Yunus, Wan Md. Zin and Kassim, Anuar and Zainal, Zulkarnain (2010) Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design. Solid State Sciences, 12 (8). pp. 1323-1327. ISSN 1293-2558 Nanocrystals Thin films 10.1016/j.solidstatesciences.2010.04.033 English
institution UPM IR
collection UPM IR
language English
English
topic Nanocrystals
Thin films
spellingShingle Nanocrystals
Thin films
Ebrahimiasl, Saeideh
Wan Yunus, Wan Md. Zin
Kassim, Anuar
Zainal, Zulkarnain
Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design
description Transparent conductive films of tin oxide were deposited on glass substrates under various deposition conditions. Taguchi analysis was used to model the dependence of the grain size, thickness and absorbance of nanocrystalline tin oxide on the process parameters namely pH value, concentration, time of deposition and bath temperature. The effect of the mentioned process parameters on the grain size, thickness and absorbance of deposited layer during the deposition of nanocrystalline was investigated using X-ray diffraction (XRD) technique, atomic force microscopy (AFM) and UV–Visible spectroscopy. Comparison between the model predictions and the experimental observations predicted a remarkable agreement between them. The predictions of the model and sensitivity analysis showed that among the effective process parameters, deposition time and concentration were the main parameters having significant effect on crystalline size. Bath temperature had the most significant effect on absorbance and deposition time had a dominant effect on thickness.
format Article
author Ebrahimiasl, Saeideh
Wan Yunus, Wan Md. Zin
Kassim, Anuar
Zainal, Zulkarnain
author_facet Ebrahimiasl, Saeideh
Wan Yunus, Wan Md. Zin
Kassim, Anuar
Zainal, Zulkarnain
author_sort Ebrahimiasl, Saeideh
title Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design
title_short Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design
title_full Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design
title_fullStr Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design
title_full_unstemmed Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design
title_sort prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by taguchi robust design
publisher Elsevier
publishDate 2010
url http://psasir.upm.edu.my/id/eprint/16286/1/Prediction%20of%20grain%20size.pdf
_version_ 1819294012910075904
score 13.4562235