Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design
Transparent conductive films of tin oxide were deposited on glass substrates under various deposition conditions. Taguchi analysis was used to model the dependence of the grain size, thickness and absorbance of nanocrystalline tin oxide on the process parameters namely pH value, concentration, time...
Gorde:
| Egile Nagusiak: | , , , |
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| Formatua: | Artikulua |
| Hizkuntza: | English English |
| Argitaratua: |
Elsevier
2010
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| Gaiak: | |
| Sarrera elektronikoa: | http://psasir.upm.edu.my/id/eprint/16286/1/Prediction%20of%20grain%20size.pdf |
| Etiketak: |
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