Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
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| 団体著者: | |
| フォーマット: | 電子媒体 eBook |
| 言語: | English |
| 出版事項: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
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| 版: | 1st ed. 2015. |
| シリーズ: | NanoScience and Technology,
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| 主題: | |
| オンライン･アクセス: | https://doi.org/10.1007/978-3-662-45240-0 |
| タグ: |
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| 要約: | This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. |
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| 物理的記述: | XV, 382 p. 189 illus., 148 illus. in color. online resource. |
| ISBN: | 9783662452400 |
| ISSN: | 1434-4904 |