Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
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| Tác giả chính: | |
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| Tác giả của công ty: | |
| Định dạng: | Điện tử eBook |
| Ngôn ngữ: | English |
| Được phát hành: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
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| Phiên bản: | 1st ed. 2015. |
| Loạt: | NanoScience and Technology,
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| Những chủ đề: | |
| Truy cập trực tuyến: | https://doi.org/10.1007/978-3-662-45240-0 |
| Các nhãn: |
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| Tóm tắt: | This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. |
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| Mô tả vật lý: | XV, 382 p. 189 illus., 148 illus. in color. online resource. |
| số ISBN: | 9783662452400 |
| số ISSN: | 1434-4904 |