Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
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| 企业作者: | |
| 格式: | 电子 电子书 |
| 语言: | English |
| 出版: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
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| 版: | 1st ed. 2015. |
| 丛编: | NanoScience and Technology,
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| 主题: | |
| 在线阅读: | https://doi.org/10.1007/978-3-662-45240-0 |
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| 总结: | This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. |
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| 实物描述: | XV, 382 p. 189 illus., 148 illus. in color. online resource. |
| ISBN: | 9783662452400 |
| ISSN: | 1434-4904 |