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Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...

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Dades bibliogràfiques
Autor principal:	Voigtländer, Bert. (Autor, http://id.loc.gov/vocabulary/relators/aut)
Autor corporatiu:	SpringerLink (Online service)
Format:	Electrònic eBook
Idioma:	English
Publicat:	Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
Edició:	1st ed. 2015.
Periòdiques:	NanoScience and Technology,
Matèries:	Nanotechnology. Condensed matter. Nanotechnology and Microengineering. Condensed Matter Physics.
Accés en línia:	https://doi.org/10.1007/978-3-662-45240-0
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

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