Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...

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Bibliographic Details
Main Author: Voigtländer, Bert. (Author, http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
Edition:1st ed. 2015.
Series:NanoScience and Technology,
Subjects:
Online Access:https://doi.org/10.1007/978-3-662-45240-0
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