Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
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| Autor Principal: | Voigtländer, Bert. (Autor, http://id.loc.gov/vocabulary/relators/aut) |
|---|---|
| Autor Corporativo: | SpringerLink (Online service) |
| Formato: | Electrónico eBook |
| Lenguaje: | English |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
|
| Edición: | 1st ed. 2015. |
| Series: | NanoScience and Technology,
|
| Materias: | |
| Acceso en línea: | https://doi.org/10.1007/978-3-662-45240-0 |
| Etiquetas: |
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