Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
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| Hoofdauteur: | |
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| Coauteur: | |
| Formaat: | Elektronisch E-boek |
| Taal: | English |
| Gepubliceerd in: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
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| Editie: | 1st ed. 2015. |
| Reeks: | NanoScience and Technology,
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| Onderwerpen: | |
| Online toegang: | https://doi.org/10.1007/978-3-662-45240-0 |
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Inhoudsopgave:
- Introduction
- Harmonic Oscillator
- Technical Aspects of Scanning Probe Microscopy
- Scanning Probe Microscopy Designs
- Electronics for Scanning Probe Microscopy
- Lock-In Technique
- Data Representation and Image Processing
- Artifacts in SPM
- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy
- Surface States
- Forces Between Tip and Sample
- Technical Aspects of Atomic force Microscopy (AFM)
- Static Atomic Force Microscopy
- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
- Intermittent Contact Mode/Tapping Mode
- Mapping of Mechanical Properties Using Force-Distance Curves
- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy
- Noise in Atomic Force Microscopy
- Quartz Sensors in Atomic force Microscopy
- Scanning Tunneling Microscopy
- Scanning Tunneling Spectroscopy (STS)
- Vibrational Spectroscopy with the STM
- Spectroscopy and Imaging of Surface States
- Building Nanostructures Atom by Atom.