Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
Kaydedildi:
| Yazar: | |
|---|---|
| Müşterek Yazar: | |
| Materyal Türü: | Elektronik Ekitap |
| Dil: | English |
| Baskı/Yayın Bilgisi: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
|
| Edisyon: | 1st ed. 2015. |
| Seri Bilgileri: | NanoScience and Technology,
|
| Konular: | |
| Online Erişim: | https://doi.org/10.1007/978-3-662-45240-0 |
| Etiketler: |
Etiketle
Etiket eklenmemiş, İlk siz ekleyin!
|
İçindekiler:
- Introduction
- Harmonic Oscillator
- Technical Aspects of Scanning Probe Microscopy
- Scanning Probe Microscopy Designs
- Electronics for Scanning Probe Microscopy
- Lock-In Technique
- Data Representation and Image Processing
- Artifacts in SPM
- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy
- Surface States
- Forces Between Tip and Sample
- Technical Aspects of Atomic force Microscopy (AFM)
- Static Atomic Force Microscopy
- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
- Intermittent Contact Mode/Tapping Mode
- Mapping of Mechanical Properties Using Force-Distance Curves
- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy
- Noise in Atomic Force Microscopy
- Quartz Sensors in Atomic force Microscopy
- Scanning Tunneling Microscopy
- Scanning Tunneling Spectroscopy (STS)
- Vibrational Spectroscopy with the STM
- Spectroscopy and Imaging of Surface States
- Building Nanostructures Atom by Atom.