Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...

Descripció completa

Guardat en:
Dades bibliogràfiques
Autor principal: Voigtländer, Bert. (Autor, http://id.loc.gov/vocabulary/relators/aut)
Autor corporatiu: SpringerLink (Online service)
Format: Electrònic eBook
Idioma:English
Publicat: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
Edició:1st ed. 2015.
Periòdiques:NanoScience and Technology,
Matèries:
Accés en línia:https://doi.org/10.1007/978-3-662-45240-0
Etiquetes: Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!