Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
Saved in:
| Hovedforfatter: | |
|---|---|
| Institution som forfatter: | |
| Format: | Electronisk eBog |
| Sprog: | English |
| Udgivet: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
|
| Udgivelse: | 1st ed. 2015. |
| Serier: | NanoScience and Technology,
|
| Fag: | |
| Online adgang: | https://doi.org/10.1007/978-3-662-45240-0 |
| Tags: |
Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!
|