Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...

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Autore principale: Voigtländer, Bert. (Autore, http://id.loc.gov/vocabulary/relators/aut)
Ente Autore: SpringerLink (Online service)
Natura: Elettronico eBook
Lingua:English
Pubblicazione: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
Edizione:1st ed. 2015.
Serie:NanoScience and Technology,
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Accesso online:https://doi.org/10.1007/978-3-662-45240-0
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