Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
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| フォーマット: | 電子媒体 eBook |
| 言語: | English |
| 出版事項: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
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| 版: | 1st ed. 2015. |
| シリーズ: | NanoScience and Technology,
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| 主題: | |
| オンライン･アクセス: | https://doi.org/10.1007/978-3-662-45240-0 |
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