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Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...

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Sparad:
Bibliografiska uppgifter
Huvudupphovsman: Voigtländer, Bert. (Författare, medförfattare, http://id.loc.gov/vocabulary/relators/aut)
Institutionell upphovsman: SpringerLink (Online service)
Materialtyp: Elektronisk E-bok
Språk:English
Publicerad: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
Upplaga:1st ed. 2015.
Serie:NanoScience and Technology,
Ämnen:
Nanotechnology.
Condensed matter.
Nanotechnology and Microengineering.
Condensed Matter Physics.
Länkar:https://doi.org/10.1007/978-3-662-45240-0
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Internet

https://doi.org/10.1007/978-3-662-45240-0

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