Kapak Resmi

Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...

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Kaydedildi:
Detaylı Bibliyografya
Yazar: Voigtländer, Bert. (Yazar, http://id.loc.gov/vocabulary/relators/aut)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: Elektronik Ekitap
Dil:English
Baskı/Yayın Bilgisi: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
Edisyon:1st ed. 2015.
Seri Bilgileri:NanoScience and Technology,
Konular:
Nanotechnology.
Condensed matter.
Nanotechnology and Microengineering.
Condensed Matter Physics.
Online Erişim:https://doi.org/10.1007/978-3-662-45240-0
Etiketler: Etiketle
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Internet

https://doi.org/10.1007/978-3-662-45240-0

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